公开(公告)号：US10734951B2

公开(公告)日：2020-08-04

申请号：US15945642

申请日：2018-04-04

Applicant: SK hynix Inc. ,  NORTHEASTERN UNIVERSITY

Inventor： Hae Kang Jung ,  Yong Suk Choi ,  Yong Bin Kim ,  Gyunam Jeon ,  Dae-Han Kwon ,  Joo Hwan Cho

IPC: H03F3/45 ,  H03F1/02 ,  H03F3/19 ,  H03G3/30 ,  H04B1/16 ,  H03K3/356

Abstract: A receiver circuit receives a signal from a semiconductor device. The receiver circuit includes an input buffer including a first plurality of transistors, the input buffer being configured to detect a fabrication condition of the receiver circuit, generate a control signal according to the detected fabrication condition, and control a gain of an input signal by adjusting a number of operating transistors among the first plurality of transistors in response to the control signal; and a latch circuit configured to latch an output signal of the input buffer, and adjust threshold voltages of a second plurality of transistors in response to a test signal.

公开(公告)号：US09998123B2

公开(公告)日：2018-06-12

申请号：US15169295

申请日：2016-05-31

Applicant: SK hynix Inc. ,  NORTHEASTERN UNIVERSITY

Inventor： Hae Kang Jung ,  Yong Bin Kim

IPC: H03L5/00 ,  H03K19/20 ,  H03K19/00

CPC classification number: H03K19/20 ,  H03K19/0005

Abstract: An impedance calibration device for a semiconductor device includes a process sensor that detects a process condition for the semiconductor device and outputs a process signal, a temperature monitoring sensor that detects a temperature of the semiconductor device and outputs a temperature signal, a converter that converts the process signal and the temperature signal into a digital signal, and a code generation circuit that generates and outputs a driving code for controlling a level of a voltage at an output node according to the digital signal of the converter and a data signal. The impedance calibration device further includes an output driver that pulls up or pulls down the voltage at the output node according to the driving code.