公开(公告)号：US20220194011A1

公开(公告)日：2022-06-23

申请号：US17639093

申请日：2020-08-25

Applicant: SLM Solutions Group AG

Inventor： Dieter Schwarze ,  Kim Kulling ,  Andreas Hoppe ,  Baerbel Kratz ,  Daniel Alberts

IPC: B29C64/393 ,  B29C64/153 ,  B22F10/28 ,  B22F10/366 ,  B22F10/368 ,  B22F12/90 ,  B33Y10/00 ,  B33Y50/02

Abstract: A device is provided, for analyzing sensor data of a sensor arranged in an apparatus for producing a three-dimensional work piece via irradiation of layers of raw material with an energy beam. The device comprises a control unit configured to receive the sensor data as a time series of data values. Each data value is indicative of a process condition within the apparatus during producing the three-dimensional work piece. The control unit is further configured to receive planning data for the three-dimensional work piece. The planning data defines a plurality of scanning vectors and a sequence according to which the energy beam is scanned along the scanning vectors. The control unit is further configured to associate data values of the time series to corresponding vector data of the scanning vectors of the planning data to form a plurality of sets of data values for corresponding scanning vectors and to define, based on the planning data, a group of at least two scanning vectors among the plurality of scanning vectors. The scanning vectors of the group meet a predefined similarity criterion. The control unit is further configured to compare the set of data values of a first scanning vector of the group to the set of data values of at least one second scanning vector of the group or to a combined set of data values derived from at least two second scanning vectors of the group, and to determine, based on the comparing, a quality measure of the work piece at a position of the first scanning vector. Further, a corresponding method and a corresponding computer program product are provided.

公开(公告)号：US11685122B2

公开(公告)日：2023-06-27

申请号：US17639093

申请日：2020-08-25

Applicant: SLM Solutions Group AG

Inventor： Dieter Schwarze ,  Kim Kulling ,  Andreas Hoppe ,  Baerbel Kratz ,  Daniel Alberts

IPC: B29C64/393 ,  B33Y10/00 ,  B33Y50/02 ,  B29C64/153 ,  B22F12/90 ,  B22F10/28 ,  B22F10/368 ,  B22F10/366

CPC classification number: B29C64/393 ,  B22F10/28 ,  B22F10/366 ,  B22F10/368 ,  B22F12/90 ,  B29C64/153 ,  B33Y10/00 ,  B33Y50/02

Abstract: A device is provided, for analyzing sensor data of a sensor arranged in an apparatus for producing a three-dimensional work piece via irradiation of layers of raw material with an energy beam. Further, a corresponding method and a corresponding computer program product are provided.