Patent search ap:("SPERRY RAND CORP") AND inv:"HUNT ARLON J" Page 1

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发明授权
Method of measuring the easy-axis and h probability density functions for thin ferromagnetic films using the longitudinal permeability hysteresis loop 失效
Title translation: 使用纵向磁导率磁滞回线测量薄铁磁薄膜的易轴和h概率密度函数的方法

公开(公告)号：US3260928A

公开(公告)日：1966-07-12

申请号：US25274263

申请日：1963-01-21

Applicant: SPERRY RAND CORP

Inventor： HUNT ARLON J , OREDSON HENRY N , TOROK ERNEST J , WHITE ROBERT A

IPC: G01R33/12

CPC classification number: G01R33/1207

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