公开(公告)号：US20230228806A1

公开(公告)日：2023-07-20

申请号：US18151330

申请日：2023-01-06

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Nicola DE CAMPO ,  Matteo VENTURELLI ,  Matteo BRIVIO ,  Mauro FOPPIANI

IPC: G01R31/28 ,  G01R19/00

CPC classification number: G01R31/2834 ,  G01R19/0038

Abstract: A system for testing is provided. The system includes an electronic circuit and an automatic testing equipment (ATE). The electronic circuit includes a voltage monitor including a resistive divider receiving at its voltage input an input voltage and coupled at its output to an input of a comparator. A reference input of the comparator is coupled to a generator supplying a reference voltage setting one or more thresholds of the comparator. The electronic circuit includes a Built In Self Test Module coupled to the ATE and to the inputs and output of the comparator. The BIST module is being configured upon receiving respective commands from the ATE to test a reaction time of the comparator and an offset of the comparator. The ATE performs a respective test of the ratio of the resistor divider by a first voltage measurement and a test of the reference voltage provided by the generator.