公开(公告)号：US11249133B2

公开(公告)日：2022-02-15

申请号：US16745813

申请日：2020-01-17

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Yann Carminati

IPC: G01R31/28 ,  G01R31/3183 ,  G01R31/319 ,  G01R31/30 ,  G08C15/04 ,  G05B11/01

Abstract: A value representative of a dispersion of a propagation delay of assemblies of electronic components is determined. A component test structure includes stages of components and a logic circuit connected in a ring. Each stage includes two assemblies of similar components configured to conduct a signal. A test device is configured to obtain values of the component test structure and to perform operations on these values.