Patent search ap:("STMicroelectronics (Crolles 2) SAS" OR "STMicroelectronics SA") AND inv:"Vincent HUARD" Page 1

1.

发明申请
FLIP FLOP OF A DIGITAL ELECTRONIC CHIP 审中-公开

公开(公告)号：US20190018062A1

公开(公告)日：2019-01-17

申请号：US16031960

申请日：2018-07-10

Applicant: STMICROELECTRONICS SA , STMICROELECTRONICS (CROLLES 2) SAS , STMICROELECTRONICS INTERNATIONAL N.V.

Inventor： Pascal URARD , Florian CACHO , Vincent HUARD , Alok Kumar TRIPATHI

IPC: G01R31/3183 , G01R31/3185 , G01R31/3177 , G01R31/317 , G01R31/3181

CPC classification number: G01R31/318342 , G01R31/31725 , G01R31/3177 , G01R31/31816 , G01R31/318541 , G01R31/318552 , G01R31/318594 , G06F17/5031

Abstract: A flip flop includes a data input, a clock input, a test chain input, a test chain output, a monitoring circuit, and an alert transmission circuit. The monitoring circuit is adapted to generate an alert if the time between arrival of a data bit and a clock edge is less than a threshold. The alert transmission circuit is adapted to apply during a monitoring phase an alert level to the test chain output in the event of an alert generated by the monitoring circuit, and to apply the alert level to the test chain output when an alert level is received at the test chain input.

2.

发明申请
METHOD FOR ESTIMATING AN OPERATING PROFILE OF AN INTEGRATED CIRCUIT OF A SYSTEM-ON-A-CHIP, AND CORRESPONDING SYSTEM-ON-A-CHIP 审中-公开

公开(公告)号：US20190285694A1

公开(公告)日：2019-09-19

申请号：US16424034

申请日：2019-05-28

Applicant: STMicroelectronics (Crolles 2) SAS , STMicroelectronics SA

Inventor： Vincent HUARD , Chittoor PARTHASARATHY

IPC: G01R31/28

Abstract: A method for determining a margin of use of an integrated circuit includes monitoring at least one sensor so as to determine at least one physical parameter representative of use of the integrated circuit, evaluating the at least one physical parameter to determine an instantaneous state of aging of the integrated circuit as a function of the at least one physical parameter, and calculating the margin of use for the integrated circuit from a comparison of the instantaneous state of aging with a presumed state of aging. If operation of the integrated circuit is outside the margin of use, at least one operating performance point of the integrated circuit is adjusted so as to bring operation of the integrated circuit back within the margin of use.

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