CURRENT MEASUREMENT DEVICE, CORRESPONDING MANUFACTURING METHOD AND METHOD OF USE

    公开(公告)号:US20240329098A1

    公开(公告)日:2024-10-03

    申请号:US18615233

    申请日:2024-03-25

    Abstract: An insulating encapsulation encapsulates a semiconductor die having an integrated Hall current sensor configured to measure an electric current flowing adjacent an active surface of the semiconductor die. An electrically conductive trace is embedded in the insulating encapsulation. First electrically conductive formations extend through the insulating encapsulation towards opposed ends of the electrically conductive trace. The first electrically conductive formations are configured to cause an electrical current subject to measurement to flow in a current flow path through the electrically conductive trace. Second electrically conductive formations extend through the insulating encapsulation towards the active surface of the semiconductor die. The second electrically conductive formations are configured to activate the Hall current sensor integrated in the semiconductor die.

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