公开(公告)号：US12032460B2

公开(公告)日：2024-07-09

申请号：US17670055

申请日：2022-02-11

Applicant: STMicroelectronics S.r.l.

Inventor： Enea Dimroci ,  Francesca Giacoma Mignemi ,  Roberta Priolo ,  Marco Leo ,  Francesco Battini

IPC: G06F11/273 ,  G06F11/26

CPC classification number: G06F11/26 ,  G06F11/273

Abstract: A method to test an asynchronous finite state machine for faults, the method including disabling state transitions out of a state of the asynchronous finite state machine and inputting test data to the AFSM to trigger a transition from the state to an expected state. The method further including enabling transitions out of the state of the asynchronous finite state machine, and determining whether the asynchronous finite state machine has performed a successful transition to the expected state.

公开(公告)号：US20230259433A1

公开(公告)日：2023-08-17

申请号：US17670055

申请日：2022-02-11

Applicant: STMicroelectronics S.r.l.

Inventor： Enea Dimroci ,  Francesca Giacoma Mignemi ,  Roberta Priolo ,  Marco Leo ,  Francesco Battini

IPC: G06F11/26

CPC classification number: G06F11/26

Abstract: A method to test an asynchronous finite state machine for faults, the method including disabling state transitions out of a state of the asynchronous finite state machine and inputting test data to the AFSM to trigger a transition from the state to an expected state. The method further including enabling transitions out of the state of the asynchronous finite state machine, and determining whether the asynchronous finite state machine has performed a successful transition to the expected state.