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公开(公告)号:US12238957B2
公开(公告)日:2025-02-25
申请号:US17329938
申请日:2021-05-25
Applicant: Samsung Display Co., Ltd.
Inventor: Wonho Jang , Sun Park , Donghyun Won
IPC: H10K50/844 , H10K59/122
Abstract: A display apparatus includes a substrate including a display area and a peripheral area, a thin film transistor including a semiconductor layer, a gate electrode, a source electrode, and a drain electrode, a first inorganic insulating layer located on the substrate and under the gate electrode and covering the semiconductor layer, a second inorganic insulating layer located on the first inorganic insulating layer and covering the gate electrode, a third inorganic insulating layer located on the second inorganic insulating layer and including a 1-3th opening in the peripheral area, an organic insulating layer located on the third inorganic insulating layer, covering the source electrode and the drain electrode, and including a second opening overlapping the 1-3th opening in the peripheral area, and a pattern portion located on a layer under the organic insulating layer and overlapping the 1-3th opening and the second opening.
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公开(公告)号:US20230320136A1
公开(公告)日:2023-10-05
申请号:US17974470
申请日:2022-10-26
Applicant: Samsung Display Co., Ltd.
Inventor: Seulki Kim , Yeeun Kang , Shoyeon Kim , Seungrae Kim , Donghyun Won
CPC classification number: H01L27/3265 , H01L27/3258 , H01L27/3262 , H01L51/56 , H01L27/1225
Abstract: A display apparatus and a method of manufacturing the same are provided. The display apparatus includes a thin-film transistor including a semiconductor layer including a source region and a gate electrode overlapping the channel region, a lower electrode disposed under the semiconductor layer, a capacitor electrically connected to the thin-film transistor and including a first capacitor electrode and a second capacitor electrode over the first capacitor electrode, the first capacitor electrode being disposed on a same layer as the lower electrode, and a first insulating layer including a first portion and a second portion, the first portion being between the lower electrode and the semiconductor layer, and the second portion being between the first capacitor electrode and the second capacitor electrode, wherein a thickness of the second portion of the first insulating layer is less than a thickness of the first portion of the first insulating layer.
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