METHOD OF INSPECTING A SENSOR
    3.
    发明申请

    公开(公告)号:US20230045474A1

    公开(公告)日:2023-02-09

    申请号:US17882592

    申请日:2022-08-07

    Abstract: A method of inspecting a sensor including generating a first model based on first big-data including first inspection results for sensors of a same type connected to a current inspection environment, generating first target characteristic coefficients for channels included in the first model, generating first characteristic coefficients for channels included in a current sensor, and generating first compensation coefficients for the channels included in the current sensor based on the first target characteristic coefficients and the first characteristic coefficients.

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