公开(公告)号：US11087653B2

公开(公告)日：2021-08-10

申请号：US16522279

申请日：2019-07-25

申请人： Samsung Display Co., Ltd.

发明人： Dae Youn Cho ,  Hyunho Kim ,  Hyojung Kim ,  Young-Joo Noh ,  Jongwoo Park ,  Ju Hee Lee ,  Jinwoo Chae ,  Youngtae Choi

IPC分类号： G09G3/00 ,  G01R31/26 ,  G09G3/20 ,  G09G3/3225

摘要： An inspection system for a display cell having a display part and a plurality of data lines connected to first and second pixel units of the display part. An array test part and a lighting test part are located in a peripheral area around the display part. An inspection apparatus is configured to provide the array test part with an array control signal to block an array data signal from being applied to a plurality of data lines in a period in which a white image is displayed and to provide the lighting test part with a lighting control signal to block a lighting data signal from being applied to a plurality of data lines during a period in which a black image is displayed, during a drive reliability test mode for displaying a test image including the black image and the white image.