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公开(公告)号:US20220086309A1
公开(公告)日:2022-03-17
申请号:US17534545
申请日:2021-11-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Changgon KIM , Jeongwon LEE
Abstract: According to certain embodiments, an electronic device includes a lens part, a driving circuit, an image sensor, a memory, and a processor. The processor may obtain a first image and a second image by using the first group pixels and the second group pixels, generate first correction candidate images based on the first image and the second PSF feature information, generate second correction candidate images based on the second image and the first PSF feature information, identify matching costs between the first correction candidate images and the second correction candidate images in a pixel basis, and determine a depth map corresponding to the matching costs between the first correction candidate images and the second correction candidate images. In addition, certain embodiments understood from the specification are possible.
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公开(公告)号:US20230042544A1
公开(公告)日:2023-02-09
申请号:US17963664
申请日:2022-10-11
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jeongwon LEE , Eunho KIM , Changgon KIM , Jaecheol BAE , Hongseok YANG , Sanghwan JEONG
Abstract: An electronic device is provided. The electronic device includes a memory, an image sensor including light receiving elements each including at least two sub light receiving elements, and an image signal processor. The image signal processor is configured to obtain images corresponding to light from outside by using the image sensor, the images including at least a raw image, a first sub image, and a second sub image, the first sub image being an image corresponding to light detected by at least one first sub light, the second sub image being an image corresponding to light detected by at least one second sub light, identify a luminance ratio between the first sub image and the second sub image, identify a defect in the raw image, based on the luminance ratio, and perform a function corresponding to a type of the defect.
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