公开(公告)号：US20130344611A1

公开(公告)日：2013-12-26

申请号：US13904526

申请日：2013-05-29

Applicant: Samsung Electronics Co., Ltd.

Inventor： Young-hee LEE ,  Gang-hee HAN ,  Dinh Loc DUONG

IPC: G01N21/17 ,  C01B31/04

CPC classification number: G01N21/17 ,  B82Y30/00 ,  B82Y40/00 ,  C01B32/182 ,  G01B11/24 ,  Y10T428/31678 ,  Y10T436/23

Abstract: A method of analyzing graphene includes providing a first graphene structure including graphene having grains and grain boundaries, and a support portion for supporting the graphene, generating a second graphene structure by oxidizing the first graphene structure, and detecting a shape of the graphene.

Abstract translation: 分析石墨烯的方法包括提供包括具有晶粒和晶界的石墨烯的第一石墨烯结构和用于支撑石墨烯的支撑部分，通过氧化第一石墨烯结构并检测石墨烯的形状产生第二石墨烯结构。