公开(公告)号：US20190130590A1

公开(公告)日：2019-05-02

申请号：US16175773

申请日：2018-10-30

Applicant: Samsung Electronics Co., Ltd.

Inventor： Andrii VOLOCHNIUK ,  Yong-Chan KEH ,  Jung-Kee LEE ,  Sung-Soon KIM ,  Sun-Kyung KIM ,  Andrii BUT ,  Andrii SUKHARIEV ,  Dmytro VAVDIYUK ,  Konstantin MOROZOV

IPC: G06T7/521

Abstract: A method of calculating depth information for a three-dimensional (3D) image includes generating a pattern based on the value of at least one cell included in a two-dimensional (2D) image, projecting the pattern, capturing a reflected image of the pattern, and calculating depth information based on the reflected image of the pattern.