公开(公告)号：US20240220376A1

公开(公告)日：2024-07-04

申请号：US18338001

申请日：2023-06-20

Applicant: Samsung Electronics Co., Ltd.

Inventor： Taewook HEO ,  Suckhyun NAM ,  Ho-Jin CHUN ,  Minha KIM

IPC: G06F11/14

CPC classification number: G06F11/1479

Abstract: Some example embodiments provide a storage device including a non-volatile memory; a microcontroller unit configured to monitor statuses of constituent elements of the storage device and output an abnormality signal based on the constituent elements not being in a normal status; and a storage controller configured to perform a first check and a second check different from the first check on a first firmware code stored in the microcontroller unit in response to the abnormality signal and perform recovery by using a second firmware code stored in the non-volatile memory based on at least one of the first check and the second check having failed.

公开(公告)号：US20240256386A1

公开(公告)日：2024-08-01

申请号：US18359406

申请日：2023-07-26

Applicant: Samsung Electronics Co., Ltd.

Inventor： Suckhyun NAM ,  Taesun PARK ,  Minsung KIL ,  Ho-Jin CHUN

IPC: G06F11/14 ,  G06F1/30 ,  G06F11/30

CPC classification number: G06F11/1417 ,  G06F1/30 ,  G06F11/3034

Abstract: A storage device includes a plurality of power circuits configured to operate sequentially to drive the storage device, a control circuit configured to, monitor a plurality of first monitoring signals received from the plurality of power circuits, and generate a retry request in response to detection of hardware initialization failure in at least one of the plurality of power circuits based on the plurality of first monitoring signals, and a power sequence circuit configured to, monitor a plurality of second monitoring signals received from the plurality of power circuits and the control circuit, and retry a hardware initialization operation for at least one power circuit of the plurality of power circuits based on the retry request and the plurality of second monitoring signals.