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公开(公告)号:US11984345B2
公开(公告)日:2024-05-14
申请号:US18135017
申请日:2023-04-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ilyoung Han , Hunyong Park , Sohee Han , Nohsung Kwak
IPC: H01L21/687
CPC classification number: H01L21/68742 , H01L21/68785
Abstract: The present disclosure is related to a substrate processing apparatus. The substrate processing apparatus may include a chuck including a plurality of pin holes and a plurality of lift pins positioned to rise and fall through the plurality of pin holes. The substrate processing apparatus may include a lift plate configured to raise and lower the lift pins. The plurality of lift pins may include a lift pin having a rod shape configured to move up and down in a pin hole of the plurality of pin holes, a flexure coupled to a lower portion of the lift pin, a weight body positioned underneath the lift plate, and a weight string connecting the flexure and the weight body. The lift plate may include a string hole through which the weight string passes through.
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公开(公告)号:US20240218561A1
公开(公告)日:2024-07-04
申请号:US18515664
申请日:2023-11-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Janghwi Lee , Yeontae Kim , Junbum Park , Hunyong Park , Suhwan Park , Sangwoo Bae , Motoshi Sakai , Wondon Joo , Jaeho Jin
Abstract: A thin-film deposition apparatus includes: a housing; a chamber located within the housing and providing an internal space; a platform disposed within the chamber and configured to support a substrate; a reflector disposed within the housing and disposed outside the chamber; a light source disposed between opposing walls of the reflector and configured to radiate light onto the substrate; a light receiver disposed within the housing, spaced apart from the light source with a portion of the reflector therebetween, and having a hole through which light emitted from the substrate is introduced; an optical cable connected to the light receiver and extending to the outside of the housing; and a sensor disposed outside the housing, connected to the optical cable, and configured to measure a temperature of the substrate by analyzing light transmitted from the optical cable.
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公开(公告)号:US11651990B2
公开(公告)日:2023-05-16
申请号:US16712413
申请日:2019-12-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ilyoung Han , Hunyong Park , Sohee Han , Nohsung Kwak
IPC: H01L21/687
CPC classification number: H01L21/68742 , H01L21/68785
Abstract: The present disclosure is related to a substrate processing apparatus. The substrate processing apparatus may include a chuck including a plurality of pin holes and a plurality of lift pins positioned to rise and fall through the plurality of pin holes. The substrate processing apparatus may include a lift plate configured to raise and lower the lift pins. The plurality of lift pins may include a lift pin having a rod shape configured to move up and down in a pin hole of the plurality of pin holes, a flexure coupled to a lower portion of the lift pin, a weight body positioned underneath the lift plate, and a weight string connecting the flexure and the weight body. The lift plate may include a string hole through which the weight string passes through.
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