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公开(公告)号:US20230306146A1
公开(公告)日:2023-09-28
申请号:US18117857
申请日:2023-03-06
发明人: SEORA PARK , JUNGSIK CHOI
CPC分类号: G06F30/10 , H01L21/67063 , H01L21/67034 , G06F2113/14
摘要: A method of manufacturing a semiconductor fabrication system may include preparing a first vacuum pipe, preparing a second vacuum pipe, connecting a first process chamber to a first pump through the first vacuum pipe, and connecting a second process chamber, which is spaced apart from the first process chamber, to a second pump through the second vacuum pipe. The preparing of the first vacuum pipe may include connecting a plurality of first unit pipes to form the first vacuum pipe and calculating a first conductance, which is a total conductance of the first vacuum pipe. The preparing of the second vacuum pipe may include forming the second vacuum pipe by connecting a plurality of second unit pipes such that the second conductance, which is a total conductance of the second vacuum pipe, is equal to the first conductance.