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公开(公告)号:US20230069493A1
公开(公告)日:2023-03-02
申请号:US17856130
申请日:2022-07-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Do-Nyun KIM , Min-Cheol KANG , Kihyun KIM , Jaehoon KIM , Jaekyung LIM
Abstract: Disclosed is an operating method of an electronic device for manufacture of a semiconductor device. The method includes receiving, at the electronic device, a computer-aided design (CAD) image for a lithography process of the semiconductor device, and generating, at the electronic device, a first scanning electron microscope (SEM) image and a first segment (SEG) image from the CAD image by using a machine learning-based module, and the first SEG image includes information about a location of a defect.