公开(公告)号：US20210020258A1

公开(公告)日：2021-01-21

申请号：US16781184

申请日：2020-02-04

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jihyuk OH ,  Jiseok Kang ,  Junho Jung

IPC: G11C29/10 ,  G06F13/16

Abstract: A memory module includes at least one semiconductor memory device, and a test pattern memory that stores first test pattern information for testing the at least one semiconductor memory device, and the first test pattern information stored in the test pattern memory is transferred to a host in a test operation. Through the memory module having the above-described function, a memory test is possible in consideration of a unique weak characteristic of the memory module.