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公开(公告)号：US20190331537A1
公开(公告)日：2019-10-31
申请号：US16161985
申请日：2018-10-16
Applicant: Samsung Electronics Co., Ltd.
Inventor： Daniel BABITCH , Kuangmin Li
Abstract: A method and system for generating a crystal model for a test product including a crystal oscillator are herein disclosed. The method includes measuring a first temperature of the test product and measuring a first frequency error of the crystal oscillator at a first calibration point during a product testing process, measuring a second temperature of the test product and measuring a second frequency error of the crystal oscillator at a second calibration point during the product testing process, estimating two parameters from the first temperature, first frequency error, second temperature, and second frequency error, and determining a 3rd order polynomial for the crystal model based on the two parameters.
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公开(公告)号：US10914643B2
公开(公告)日：2021-02-09
申请号：US16884620
申请日：2020-05-27
Applicant: Samsung Electronics Co., Ltd.
Inventor： Daniel Babitch , Kuangmin Li
Abstract: A method and system for generating a crystal model for a test product including a crystal oscillator are herein disclosed. The method includes measuring a first temperature of the test product and measuring a first frequency error of the crystal oscillator at a first calibration point during a product testing process, measuring a second temperature of the test product and measuring a second frequency error of the crystal oscillator at a second calibration point during the product testing process, estimating two parameters from the first temperature, first frequency error, second temperature, and second frequency error, and determining a 3rd order polynomial for the crystal model based on the two parameters.
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公开(公告)号：US10823623B2
公开(公告)日：2020-11-03
申请号：US16161985
申请日：2018-10-16
Applicant: Samsung Electronics Co., Ltd.
Inventor： Daniel Babitch , Kuangmin Li
Abstract: A method and system for generating a crystal model for a test product including a crystal oscillator are herein disclosed. The method includes measuring a first temperature of the test product and measuring a first frequency error of the crystal oscillator at a first calibration point during a product testing process, measuring a second temperature of the test product and measuring a second frequency error of the crystal oscillator at a second calibration point during the product testing process, estimating two parameters from the first temperature, first frequency error, second temperature, and second frequency error, and determining a 3rd order polynomial for the crystal model based on the two parameters.
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