公开(公告)号：US20150233996A1

公开(公告)日：2015-08-20

申请号：US14526849

申请日：2014-10-29

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kun-Yong Yoon ,  Jae-Jin Park ,  Ji-Hwan Hyun

IPC: G01R31/02 ,  G01R31/28 ,  G01R1/30

CPC classification number: G01R31/025 ,  G01R31/2851

Abstract: An integrated circuit includes an operational circuit and a test circuit for measuring a leakage current associated with all or part of the operational circuit. The leakage current measurement circuit may include a mirror circuit configured to mirror leakage current to a current-to-voltage converter and an analog-to-digital converter configured to convert the analog voltage representative of the leakage current developed by the current-to-voltage converter to a digital value.

Abstract translation: 集成电路包括用于测量与全部或部分操作电路相关联的漏电流的操作电路和测试电路。 泄漏电流测量电路可以包括被配置为将漏电流镜像到电流 - 电压转换器的镜电路和被配置为转换表示由电流 - 电压产生的漏电流的模拟电压的模数转换器 转换器到数字值。

公开(公告)号：US09632126B2

公开(公告)日：2017-04-25

申请号：US14526849

申请日：2014-10-29

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kun-Yong Yoon ,  Jae-Jin Park ,  Ji-Hwan Hyun

IPC: G05F5/00 ,  G01R31/02 ,  G01R31/28

CPC classification number: G01R31/025 ,  G01R31/2851

Abstract: An integrated circuit includes an operational circuit and a test circuit for measuring a leakage current associated with all or part of the operational circuit. The leakage current measurement circuit may include a mirror circuit configured to mirror leakage current to a current-to-voltage converter and an analog-to-digital converter configured to convert the analog voltage representative of the leakage current developed by the current-to-voltage converter to a digital value.