VERTICAL FIELD-EFFECT TRANSISTOR DEVICES AND METHODS OF FORMING THE SAME

    公开(公告)号:US20250120162A1

    公开(公告)日:2025-04-10

    申请号:US18989196

    申请日:2024-12-20

    Abstract: Vertical field-effect transistor (VFET) devices and methods of forming the same are provided. The methods may include forming a lower structure on a substrate. The lower structure may include first and second VFETs, a preliminary isolation structure between the first and second VFETs, and a gate liner on opposing sides of the preliminary isolation structure and between the preliminary isolation structure and the substrate. Each of the first and second VFETs may include a bottom source/drain region, a channel region and a top source/drain region sequentially stacked, and a gate structure on a side surface of the channel region. The preliminary isolation structure may include a sacrificial layer and a gap capping layer sequentially stacked. The methods may also include forming a top capping layer on the lower structure and then forming a cavity between the first and second VFETs by removing the sacrificial layer.

    VERTICAL FIELD-EFFECT TRANSISTOR DEVICES AND METHODS OF FORMING THE SAME

    公开(公告)号:US20240170338A1

    公开(公告)日:2024-05-23

    申请号:US18418795

    申请日:2024-01-22

    CPC classification number: H01L21/823487 H01L21/823437 H01L21/823481

    Abstract: Vertical field-effect transistor (VFET) devices and methods of forming the same are provided. The methods may include forming a lower structure on a substrate. The lower structure may include first and second VFETs, a preliminary isolation structure between the first and second VFETs, and a gate liner on opposing sides of the preliminary isolation structure and between the preliminary isolation structure and the substrate. Each of the first and second VFETs may include a bottom source/drain region, a channel region and a top source/drain region sequentially stacked, and a gate structure on a side surface of the channel region. The preliminary isolation structure may include a sacrificial layer and a gap capping layer sequentially stacked. The methods may also include forming a top capping layer on the lower structure and then forming a cavity between the first and second VFETs by removing the sacrificial layer.

    VERTICAL FIELD-EFFECT TRANSISTOR DEVICES AND METHODS OF FORMING THE SAME

    公开(公告)号:US20210242091A1

    公开(公告)日:2021-08-05

    申请号:US17035857

    申请日:2020-09-29

    Abstract: Vertical field-effect transistor (VFET) devices and methods of forming the same are provided. The methods may include forming a lower structure on a substrate. The lower structure may include first and second VFETs, a preliminary isolation structure between the first and second VFETs, and a gate liner on opposing sides of the preliminary isolation structure and between the preliminary isolation structure and the substrate. Each of the first and second VFETs may include a bottom source/drain region, a channel region and a top source/drain region sequentially stacked, and a gate structure on a side surface of the channel region. The preliminary isolation structure may include a sacrificial layer and a gap capping layer sequentially stacked. The methods may also include forming a top capping layer on the lower structure and then forming a cavity between the first and second VFETs by removing the sacrificial layer.

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