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公开(公告)号:US20150243733A1
公开(公告)日:2015-08-27
申请号:US14605041
申请日:2015-01-26
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jung-gil YANG , Sang-su KIM , Tae-yong KWON
CPC classification number: H01L29/0673 , H01L29/42392 , H01L29/66431 , H01L29/66545 , H01L29/775 , H01L29/785 , H01L29/78696
Abstract: A semiconductor device comprises at least two nanowire patterns over a substrate, wherein the at least two nanowire patterns have increasingly narrower widths as they extend away from the substrate and have different channel impurity concentrations. A gate electrode surrounds at least a part of the at least two nanowire patterns. A gate dielectric film is disposed between the at least two nanowire patterns and the gate electrode.
Abstract translation: 半导体器件在衬底上包括至少两个纳米线图案,其中当它们远离衬底延伸并且具有不同的沟道杂质浓度时,至少两个纳米线图案具有越来越窄的宽度。 栅电极围绕至少两个纳米线图案的至少一部分。 栅电介质膜设置在至少两个纳米线图案和栅电极之间。
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公开(公告)号:US20200051981A1
公开(公告)日:2020-02-13
申请号:US16257913
申请日:2019-01-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jung-gil YANG , Sang-su KIM , Sun-wook KIM , Geum-jong BAE , Seung-min SONG , Soo-jin JEONG
IPC: H01L27/092 , H01L29/08 , H01L29/06 , H01L29/66 , H01L29/423 , H01L29/78 , H01L21/02 , H01L21/8238
Abstract: A semiconductor device includes: a fin-type active area extending in a first direction protruding from a substrate; a plurality of nanosheet stacked structures; a blocking film covering a part of the upper surface and one sidewall of each of a pair of nanosheet stacked structures adjacent to both sides of the fin-type active area among the plurality of nanosheet stacked structures; a gate electrode extending in a second direction intersecting the first direction on the fin-type active area, the gate electrode including a real gate electrode surrounding the plurality of nanosheets and a dummy gate electrode disposed on the blocking film; and a gate dielectric layer between the real gate electrode and the plurality of nanosheets and between the dummy gate electrode and the blocking film.
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