公开(公告)号：US12229936B2

公开(公告)日：2025-02-18

申请号：US17721616

申请日：2022-04-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Ho Joon Lee ,  Il Kwon Kim ,  Sang Gul Park ,  Chang Wook Jeong ,  Moon Hyun Cha ,  Sat Byul Kim

IPC: G06T7/00 ,  G06T1/00 ,  G06T3/40 ,  G06T3/4053 ,  G06T5/00 ,  G06T5/20 ,  G06T5/70 ,  G06T11/00

Abstract: Some example embodiments relate to a super resolution scanning electron microscope (SEM) image implementing device and/or a method thereof. Provided a super resolution scanning electron microscope (SEM) image implementing device comprising a processor configured to crop a low resolution SEM image to generate a first cropped image and a second cropped image, to upscale the first cropped image and the second cropped image to generate a first upscaled image and a second upscaled image, and to cancel noise from the first upscaled image and the second upscaled image to generate a first noise canceled image and a second noise canceled image.