公开(公告)号：US20140334767A1

公开(公告)日：2014-11-13

申请号：US14199081

申请日：2014-03-06

Applicant: Samsung Electronics Co., Ltd.

Inventor： Soo Chul LIM ,  Joon Ah PARK ,  Hyun Jeong LEE ,  Seong Ju HAN ,  Kyung Won MOON

IPC: G01L1/24

CPC classification number: G01L1/246 ,  G01L5/105 ,  G06F3/0414 ,  G06F3/0421

Abstract: An apparatus and method for measuring bending of an object, a position of an item touching the object, and a shearing force of the item using an optical waveguide may include a frequency measurer to measure a frequency of light reflected from a grating of an optical waveguide, and a bending measurer to determine bending of an object to which the optical waveguide is attached using the frequency.

Abstract translation: 使用光波导测量物体的弯曲，接触物体的位置和物品的剪切力的装置和方法可以包括测量从光波导的光栅反射的光的频率的频率测量器 以及弯曲测量器，用于使用频率来确定安装有光波导的物体的弯曲。