公开(公告)号：US20040260503A1

公开(公告)日：2004-12-23

申请号：US10820747

申请日：2004-04-09

Applicant: Samsung Electronics Co., Ltd.

Inventor： Je-hyoung Ryu ,  Sung-jin Lee ,  Jun-ho Lee ,  Tae-gyu Kim

IPC: G06F019/00

CPC classification number: G01R31/2877

Abstract: An inspecting apparatus for a semiconductor device having a match plate; a contact module combined with the match plate, including a radiation unit contacting a semiconductor device, and a test unit pressing leads of the semiconductor device; and a thermally conductive pad installed on a contacting face of the radiation unit of the contact module, to transfer heat from the semiconductor device to the radiation unit of the contact module. The present invention provides an inspecting apparatus for semiconductor devices that improves reliability of testing for durability of semiconductor devices against heat, and minimizes damage to the semiconductor devices during testing.

Abstract translation: 一种具有匹配板的半导体器件的检查装置; 与所述匹配板组合的接触模块，包括接触半导体器件的辐射单元和所述半导体器件的压接引线的测试单元; 以及安装在接触模块的辐射单元的接触面上的导热焊盘，用于将热量从半导体器件传递到接触模块的辐射单元。 本发明提供一种用于半导体器件的检查装置，其提高半导体器件耐热耐久性的测试的可靠性，并且在测试期间最小化对半导体器件的损坏。

公开(公告)号：US20030047435A1

公开(公告)日：2003-03-13

申请号：US10053589

申请日：2002-01-24

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sung-jin Lee ,  Soon-kyo Hong ,  Chul-woo Lee ,  Young-woo Huh ,  Woo-jong Lee ,  Woo-jong Cho

IPC: H01H013/70

CPC classification number: H01H3/125 ,  H01H2215/022

Abstract: A key switch of a keyboard of the present invention includes a key cap and an elastic body which supports and allows the key cap to elastically move up and down. The elastic body is a band shaped structure and includes end portions which are pivotally supported above a substrate, a central portion bulged to contact a bottom surface of the key cap, and curved portions having a curvature opposite to that of the central portion disposed between corresponding ones of the end portions and the central portion. The curved portions of the elastic body are deformed at a position lower than an upper surface of the substrate. Therefore, the overall height of the key switch can be reduced, allowing for the manufacture of a slimmer keyboard unit.

Abstract translation: 本发明的键盘的键开关包括键帽和弹性体，其支撑并允许键帽上下弹性地移动。 弹性体是带状结构，并且包括枢转地支撑在基底上的端部，凸起以接触键帽的底表面的中心部分和具有与设置在对应的中心部分之间的中心部分的曲率相反的曲率的弯曲部分 端部和中心部分。 弹性体的弯曲部在比基板的上表面低的位置变形。 因此，可以减小钥匙开关的整体高度，从而允许制造更细长的键盘单元。

公开(公告)号：US20040263194A1

公开(公告)日：2004-12-30

申请号：US10823546

申请日：2004-04-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Je-hyoung Ryu ,  Tae-gyu Kim ,  Soon-kyu Yim ,  Sung-jin Lee ,  Jun-ho Lee

IPC: G01R031/26

CPC classification number: G01R1/0458

Abstract: An inspecting apparatus for semiconductor devices including: a match plate; a contact module combined with the match plate, and the match plate including a radiation unit radiating heat from the semiconductor devices to the outside, and a test unit contacting leads of the semiconductor; an insert module installed on a bottom of the contact module, and having a semiconductor device accommodator to accommodate the semiconductor device; and an auxiliary radiation member installed on a bottom of the insert module, and radiating the heat from the semiconductor device to the outside. Accordingly, the inspecting apparatus for semiconductor device according to the present invention performs testing at a constant temperature regardless of heat from the semiconductors by radiating the heat from the semiconductors immediately and efficiently, thereby producing more accurate test results. Accurate testing improves productivity and saves expense by removing faulty test results caused by identifying a qualified semiconductor as a defective semiconductor due to heat radiated from the semiconductor device.

Abstract translation: 一种用于半导体器件的检查装置，包括：匹配板; 与所述匹配板组合的接触模块，所述匹配板包括从所述半导体器件向外部辐射热的辐射单元，以及接触所述半导体的引线的测试单元; 插入模块，安装在所述触点模块的底部，并且具有用于容纳所述半导体器件的半导体器件容纳器; 以及安装在所述插入模块的底部上的辅助辐射构件，并且将来自所述半导体器件的热量散发到外部。 因此，根据本发明的半导体装置的检查装置不管来自半导体的热量是恒定的，通过立即有效地辐射来自半导体的热量进行测试，从而产生更准确的测试结果。 通过从半导体器件辐射的热量，通过识别合格的半导体作为有缺陷的半导体而导致的故障测试结果，可以提高生产率并节省成本。

公开(公告)号：US20040263193A1

公开(公告)日：2004-12-30

申请号：US10820748

申请日：2004-04-09

Applicant: Samsung Electronics Co., Ltd.

Inventor： Je-hyoung Ryu ,  Tae-gyu Kim ,  Jun-ho Lee ,  Sung-jin Lee ,  Hong-yong Lee

IPC: G01R031/26

CPC classification number: G01R1/0458

Abstract: An inspecting apparatus for semiconductor devices comprising: a match plate; a contact module combined with the match plate, itself comprising a radiator to radiate heat from the semiconductor device to the outside and a tester to contact the leads of the semiconductor device; and a heat pipe provided in the radiator. Accordingly, the inspecting apparatus for semiconductor devices according to the present invention performs testing at a constant temperature, regardless of heat from the semiconductor device, by transferring heat from the semiconductor device quickly and efficiently, thereby producing more accurate test results. The inspecting apparatus for semiconductor devices according to the present invention improves productivity and saves expense by removing faulty test results caused by incorrectly identifying qualified semiconductor devices as defective semiconductor devices.

Abstract translation: 一种用于半导体器件的检查装置，包括：匹配板; 与该匹配板结合的接触模块本身包括将半导体器件的热辐射到外部的辐射器和与半导体器件的引线接触的测试器; 以及设置在散热器中的热管。 因此，根据本发明的半导体器件的检查装置通过从半导体器件中快速有效地传递热量而不管来自半导体器件的热量在恒定温度下进行测试，从而产生更准确的测试结果。 根据本发明的半导体器件的检查装置通过消除由于错误地识别作为有缺陷的半导体器件的合格半导体器件而引起的故障测试结果，提高了生产率并节省了费用。

公开(公告)号：US20030063065A1

公开(公告)日：2003-04-03

申请号：US10238879

申请日：2002-09-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sung-jin Lee ,  Soon-kyo Hong ,  Chul-woo Lee ,  Woo-jong Lee ,  Woo-jong Cho

IPC: G09G005/00

CPC classification number: G06F3/043 ,  G06F3/0346

Abstract: A host apparatus includes an ultrasound receiving unit receiving an ultrasound signal from a pointing apparatus and outputting an electric signal. A controlling unit calculates a position of a pointer on a display screen corresponding to a position of the pointing apparatus based on the electric signal from the ultrasound receiving unit, and outputs a control signal to the display screen to position the pointer at the calculated position of the display screen.

Abstract translation: 主机装置包括从指示装置接收超声信号并输出​​电信号的超声波接收装置。 控制单元基于来自超声波接收单元的电信号计算与指示装置的位置相对应的显示画面上的指针的位置，并将控制信号输出到显示画面，以将指针定位在 显示屏幕。