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公开(公告)号:US20200343364A1
公开(公告)日:2020-10-29
申请号:US16572681
申请日:2019-09-17
发明人: Donghyun KIM , Inhyun SONG , Yeongmin JEON , Sejin PARK , Juyun PARK , Jonghoon BAEK , Taeyeon SHIN , Sooyeon JEONG
IPC分类号: H01L29/66 , H01L21/8234 , H01L27/088 , H01L29/78
摘要: A semiconductor device may include: a dummy gate structure including a first gate pattern in which dummy gate lines extending in one direction are connected to each other on a substrate, and a second gate pattern in which dummy gate lines extending in the one direction are connected to each other on the same line with the first gate pattern; and a third gate pattern extending in parallel with the dummy gate structure on one side of the dummy gate structure.