公开(公告)号：US08928341B2

公开(公告)日：2015-01-06

申请号：US13737286

申请日：2013-01-09

Applicant: Samsung Electronics Co. Ltd.

Inventor： Han-Awl Lee ,  Jae-Kyu Lee ,  Woong-Hae Choi ,  Byoung-Hee Lee

IPC: G01R31/00 ,  G01R31/319

CPC classification number: G01R31/31924 ,  G01R31/001 ,  G01R31/002 ,  H04M1/24

Abstract: An apparatus and a method for automated testing of electrostatic discharge of a Device Under Test (DUT) are provided. In the apparatus and the method, an electrostatic pulse is applied to the DUT, a malfunction type is detected from the DUT, and a control command is transmitted to the DUT to return a test mode of the DUT to a normal mode according to the detected malfunction type.

Abstract translation: 提供了一种用于自动测试被测设备（DUT）的静电放电的设备和方法。 在该装置和方法中，向DUT施加静电脉冲，从DUT检测到故障类型，并且向DUT发送控制命令，以根据检测到的DUT将测试模式返回到正常模式 故障类型。