APPARATUS AND TECHNIQUES OF NON-INVASIVE ANALYSIS
    2.
    发明申请
    APPARATUS AND TECHNIQUES OF NON-INVASIVE ANALYSIS 审中-公开
    非入侵分析的设备和技术

    公开(公告)号:US20130023773A1

    公开(公告)日:2013-01-24

    申请号:US13639818

    申请日:2011-04-07

    IPC分类号: A61B6/00

    CPC分类号: A61B5/01 A61B5/0077 A61B5/444

    摘要: Apparatus and methods, which comprise examination of an abnormality on a subject using a temperature stimulus applied to the subject, provide a non-invasive analysis technique. In an embodiment, a non-invasive infrared imaging technique can be used to observe the temporal response of a lesion to temperature stimuli to form a basis for evaluating the abnormality. A technique including applying temperature stimuli and detecting responses to the applied temperature stimuli provide a non-invasive technique that can be used to identify an abnormality on a subject and/or characteristics of the abnormality. In an embodiment, a non-invasive transient infrared imaging technique can be used to observe the temporal response of a lesion to temperature stimuli to form a basis for determining characteristics correlated to the lesion. Additional apparatus, systems, and methods are disclosed.

    摘要翻译: 包括使用应用于受试者的温度刺激对受试者的异常进行检查的装置和方法提供非侵入性分析技术。 在一个实施例中,可以使用非侵入性红外成像技术来观察病变对温度刺激的时间反应,以形成用于评估异常的基础。 包括对所施加的温度刺激应用温度刺激和检测反应的技术提供了可用于识别受试者的异常和/或异常特征的非侵入性技术。 在一个实施例中,可以使用非侵入性瞬时红外成像技术来观察病变对温度刺激的时间反应,以形成用于确定与病变相关的特征的基础。 公开了附加装置,系统和方法。