PROGRAMMABLE SCAN CHAIN DEBUG TECHNIQUE
    2.
    发明公开

    公开(公告)号:US20230266388A1

    公开(公告)日:2023-08-24

    申请号:US17679686

    申请日:2022-02-24

    CPC classification number: G01R31/3177

    Abstract: A method includes injecting scan patterns into an input of a decompressor that distributes the scan patterns to a plurality of scan chains whose outputs are coupled to inputs of a compressor, which provides a compressed scan test result representing the plurality of scan chains. The method also includes, in response to the compressed scan test result being indicative of failure, identifying a particular scan chain of the plurality of scan chains that is responsible for the failure by a debug circuit that is coupled to the input of the decompressor and to a compressor output. The debug circuit enables an output of any single scan chain of the plurality of scan chains to be available at the compressor output while suppressing outputs of all other scan chains of the plurality of scan chains.

Patent Agency Ranking