ON-CHIP CLOCK CONTROL MONITORING
    1.
    发明申请

    公开(公告)号:US20190212387A1

    公开(公告)日:2019-07-11

    申请号:US15864584

    申请日:2018-01-08

    Abstract: An on-chip clock (OCC) circuit of an integrated circuit includes a clock generator, an OCC controller, and an OCC observation circuit. The clock generator is configured to generate a plurality of clock signals. The OCC controller is configured to receive the clock signals and generate an OCC output for use by the scan chains of logic blocks. The OCC observation circuit is configured to generate a status output on a status output port based on the OCC output during an at-speed capture phase and a scan enable signal. Patterns of the status output with respect to the scan enable signal include a valid pattern indicating that the OCC output includes a valid number of at-speed capture pulses, a first invalid pattern indicating a first error in the OCC output, and a second invalid pattern indicating a second error in the OCC output that is different from the first error.

    On-chip clock control monitoring
    2.
    发明授权

    公开(公告)号:US10459029B2

    公开(公告)日:2019-10-29

    申请号:US15864584

    申请日:2018-01-08

    Abstract: An on-chip clock (OCC) circuit of an integrated circuit includes a clock generator, an OCC controller, and an OCC observation circuit. The clock generator is configured to generate a plurality of clock signals. The OCC controller is configured to receive the clock signals and generate an OCC output for use by the scan chains of logic blocks. The OCC observation circuit is configured to generate a status output on a status output port based on the OCC output during an at-speed capture phase and a scan enable signal. Patterns of the status output with respect to the scan enable signal include a valid pattern indicating that the OCC output includes a valid number of at-speed capture pulses, a first invalid pattern indicating a first error in the OCC output, and a second invalid pattern indicating a second error in the OCC output that is different from the first error.

Patent Agency Ranking