公开(公告)号：US20220011375A1

公开(公告)日：2022-01-13

申请号：US17294780

申请日：2019-11-12

Applicant: Semiconductor Energy Laboratory Co., Ltd.

Inventor： Kei TAKAHASHI ,  Yuki OKAMOTO ,  Minato ITO ,  Takahiro ISHIZU

IPC: G01R31/396 ,  H02J7/00

Abstract: A semiconductor device that tests and/or monitors each of batteries provided in an assembled battery is provided. The semiconductor device includes a hysteresis comparator and a circuit, and the circuit has a function of setting a high-level side threshold voltage and a low-level side voltage of the hysteresis comparator. The circuit includes first and second capacitors. A first terminal of the first capacitor is electrically connected to a high-level side reference potential input terminal of the hysteresis comparator and a first terminal of the second capacitor is electrically connected to a low-level side reference potential input terminal of the hysteresis comparator. After a first reference potential is input to the high-level side reference potential input terminal and a second reference potential is input to the low-level side reference potential input terminal, a negative electrode of a cell is electrically connected to each second terminal of the first and second capacitors, whereby the potential of each first terminal of the first and second capacitors is changed.