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公开(公告)号:US5286334A
公开(公告)日:1994-02-15
申请号:US779677
申请日:1991-10-21
IPC分类号: H01L21/205 , C30B25/02 , C30B25/00
摘要: A method of depositing Ge on a Si substrate in a reaction chamber includes the steps of: precleaning the substrate; evacuating the chamber to a pressure below 10.sup.-7 Torr; heating the substrate to 300.degree.-600.degree. C.; and providing a GeH.sub.4 /B.sub.2 H.sub.6 /He mixture of gas with a GeH.sub.4 partial pressure of 2-50 mTorr and a B.sub.2 H.sub.6 partial pressure of 0.08 to 2 mTorr.
摘要翻译: 在反应室中在Si衬底上沉积Ge的方法包括以下步骤:预清洗衬底; 将室排空至低于10-7乇的压力; 将基板加热至300度至600度; 并提供GeH4 / B2H6 / He混合气体,GeH4分压为2-50mTorr,B2H6分压为0.08〜2mTorr。