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公开(公告)号:US20090045810A1
公开(公告)日:2009-02-19
申请号:US12256798
申请日:2008-10-23
申请人: Shinji Sugihara , Hideto Ando , Shinich Sasaki
发明人: Shinji Sugihara , Hideto Ando , Shinich Sasaki
CPC分类号: H01L27/22 , B82Y25/00 , G01R33/093 , Y10T29/4902
摘要: A magnetic detecting device includes a first and a second magnetoresistive element, and a first and a second fixed resistor connected in series to the first and the second magnetoresistive element, respectively. The first and the second magnetoresistive element each include a pinned magnetic layer and a free magnetic layer with a nonmagnetic conductive layer in between. The first and the second magnetoresistive element have the same layer structure except that the nonmagnetic conductive layers have different thicknesses. The thicknesses of the nonmagnetic conductive layers are set so that a positive interlayer coupling magnetic field acts between the free magnetic layer and the pinned magnetic layer of the first magnetoresistive element and a negative interlayer coupling magnetic field acts between the free magnetic layer and the pinned magnetic layer of the second magnetoresistive element. The first and the second fixed resistor have the same layer structure.
摘要翻译: 磁检测装置包括分别与第一和第二磁阻元件串联连接的第一和第二磁阻元件以及第一和第二固定电阻器。 第一和第二磁阻元件各自包括钉扎磁性层和其间具有非磁性导电层的自由磁性层。 第一和第二磁阻元件具有相同的层结构,除了非磁性导电层具有不同的厚度。 非磁性导电层的厚度被设定为使得正的层间耦合磁场作用在自由磁性层和第一磁阻元件的被钉扎的磁性层之间,负的层间耦合磁场作用在自由磁性层和固定磁体之间 第二磁阻元件的层。 第一和第二固定电阻具有相同的层结构。