公开(公告)号：US11226371B2

公开(公告)日：2022-01-18

申请号：US16685450

申请日：2019-11-15

Applicant: Silicon Laboratories Inc.

Inventor： Yuwono Kurnia Rahman ,  Pasi Rahikkala ,  Kian Jin Chua ,  Zhiyuan Guan ,  Wei Jue Lim

IPC: G01R31/304 ,  G01R27/06 ,  G01R31/303

Abstract: A test system for testing RF PCBs including an RF probe for interfacing an intermediate node of each RF PCB, an RF source providing an RF test signal, a reflectometer, and a test measurement system that makes a pass/fail determination of each RF PCB using a measured reflection coefficient. Each RF PCB includes an IC matching circuit and an antenna matching circuit coupled between an RFIC and an antenna, in which the intermediate RF node is between the matching circuits. The reflectometer outputs a measured reflection coefficient indicative of a comparison between a reflected RF signal and the RF test signal. The measured reflection coefficient may be corrected using error values based on a calibration procedure using a calibration kit with modified RF PCBs with known loads. The modified RF PCBs are measured with a network analyzer and the test system to calculate the error values used for production testing.

公开(公告)号：US20210148973A1

公开(公告)日：2021-05-20

申请号：US16685450

申请日：2019-11-15

Applicant: Silicon Laboratories Inc.

Inventor： Yuwono Kurnia Rahman ,  Pasi Rahikkala ,  Kian Jin Chua ,  Zhiyuan Guan ,  Wei Jue Lim

IPC: G01R31/304 ,  G01R31/303 ,  G01R27/06

Abstract: A test system for testing RF PCBs including an RF probe for interfacing an intermediate node of each RF PCB, an RF source providing an RF test signal, a reflectometer, and a test measurement system that makes a pass/fail determination of each RF PCB using a measured reflection coefficient. Each RF PCB includes an IC matching circuit and an antenna matching circuit coupled between an RFIC and an antenna, in which the intermediate RF node is between the matching circuits. The reflectometer outputs a measured reflection coefficient indicative of a comparison between a reflected RF signal and the RF test signal. The measured reflection coefficient may be corrected using error values based on a calibration procedure using a calibration kit with modified RF PCBs with known loads. The modified RF PCBs are measured with a network analyzer and the test system to calculate the error values used for production testing.