公开(公告)号：US20120044488A1

公开(公告)日：2012-02-23

申请号：US13131461

申请日：2009-11-03

Applicant: Stéphane Senac

Inventor： Stéphane Senac

IPC: G01J3/30

CPC classification number: G01J3/443 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/0291 ,  G01N21/718 ,  G01N2201/0221

Abstract: A device for analyzing materials by plasma spectroscopy is of the portable and independent type, comprising a housing (10) containing a laser generator (18) that emits laser pulses that are focused on the surface of a material to be analyzed by means of a parabolic mirror (32) that is movable in translation inside the housing in order to perform a series of spot measurements along a scan line on the surface of the material to be analyzed and in order to take a measurement from a calibration sample (50) mounted in the measurement endpiece (22) of the housing (10).

Abstract translation: 用于通过等离子体光谱法分析材料的装置是便携式和独立型的装置，包括：壳体（10），其包含激光发生器（18），激光发生器（18）发射激光脉冲，所述激光脉冲通过抛物面方式聚焦在待分析材料的表面上 反射镜（32），其可在壳体内平移地移动，以便沿着要分析的材料的表面上的扫描线执行一系列点测量，并且为了从安装在所述待校准样品中的校准样品（50）进行测量 壳体（10）的测量端部（22）。

公开(公告)号：US08436991B2

公开(公告)日：2013-05-07

申请号：US13131461

申请日：2009-11-03

Applicant: Stéphane Senac

Inventor： Stéphane Senac

IPC: G01J3/30

CPC classification number: G01J3/443 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/0291 ,  G01N21/718 ,  G01N2201/0221

Abstract: A device for analyzing materials by plasma spectroscopy is of the portable and independent type, comprising a housing (10) containing a laser generator (18) that emits laser pulses that are focused on the surface of a material to be analyzed by means of a parabolic mirror (32) that is movable in translation inside the housing in order to perform a series of spot measurements along a scan line on the surface of the material to be analyzed and in order to take a measurement from a calibration sample (50) mounted in the measurement endpiece (22) of the housing (10).

Abstract translation: 用于通过等离子体光谱法分析材料的装置是便携式和独立型的装置，包括：壳体（10），其包含激光发生器（18），激光发生器（18）发射激光脉冲，所述激光脉冲通过抛物面方式聚焦在待分析材料的表面上 反射镜（32），其可在壳体内平移地移动，以便沿着要分析的材料的表面上的扫描线执行一系列点测量，并且为了从安装在所述待校准样品中的校准样品（50）进行测量 壳体（10）的测量端部（22）。