GATE-STRESS TEST CIRCUIT WITHOUT TEST PAD
    1.
    发明申请
    GATE-STRESS TEST CIRCUIT WITHOUT TEST PAD 有权
    没有测试垫的门极应力测试电路

    公开(公告)号:US20130169318A1

    公开(公告)日:2013-07-04

    申请号:US13708812

    申请日:2012-12-07

    Inventor: Lin LI

    CPC classification number: H03K19/00361 G01R31/2621

    Abstract: A high side driver circuit includes a driver stage having an input, an output, a first power terminal and a second power terminal, a transistor having a first power terminal, a second power terminal, and a control terminal coupled to the output of the driver stage, and a switch coupled between the second power terminal of the driver stage and the second power terminal of the transistor.

    Abstract translation: 高侧驱动器电路包括具有输入端,输出端,第一电源端子和第二电源端子的驱动级,具有第一电源端子,第二电源端子和耦合到驱动器的输出端的控制端子的晶体管 并且耦合在驱动器级的第二电源端子和晶体管的第二电源端子之间的开关。

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