公开(公告)号：US20210199714A1

公开(公告)日：2021-07-01

申请号：US17135240

申请日：2020-12-28

申请人： Synopsys, Inc.

发明人： Ankush Bharati OBERAI ,  Rupa Sunil KAMOJI

IPC分类号： G01R31/311 ,  G01N23/2255 ,  H01J37/285

摘要： A method includes capturing a photon emission microscope (PEM) image of an integrated circuit (IC), and identifying emission sites in the PEM image, where the emission sites are associated with a leakage current. A set of common nets is found that connects multiple emission sites using layout data and/or netlist data in computer-aided design (CAD) data. From the layout data and/or netlist data, a critical net is identified from the set of common nets connecting a threshold number of emission sites. The critical net is cross-mapped, by a processor, tip netlist data in the CAD data. A particular device is identified from the netlist data that has an output pin connected to the critical net. The particular device identified from the netlist data is cross-mapped, by a processor, to the layout data, wherein the critical net connects at least two devices at the identified emission sites including the particular device.