专利检索 ap:("Synopsys, Inc.") AND inv:"Jong Beom Park" 第 1 页

1.

发明授权
Fast effective resistance estimation using machine learning regression algorithms 有权

公开(公告)号：US12032889B2

公开(公告)日：2024-07-09

申请号：US17190336

申请日：2021-03-02

申请人： Synopsys, Inc.

发明人： Jong Beom Park

IPC分类号： G06F30/36 , G06F18/23213 , G06F30/373 , G06F30/39 , G06N7/00 , G06N20/10 , G06F119/06 , G06N20/00

CPC分类号： G06F30/36 , G06F30/373 , G06F30/39 , G05B2219/45028 , G06F18/23213 , G06F2119/06 , G06N7/00 , G06N20/00 , G06N20/10

摘要： Various embodiments of a method and apparatus for estimating the effective resistance for the design of on-chip power nets are disclosed. Through sampled node resistance, performance of a power net can be determined on an entire chip. Effective resistance predictions can be made for all nodes. Through the resistance predictions, a designer can analyze the which areas would benefit from power and ground augmentation.

2.

发明申请
Fast Effective Resistance Estimation using Machine Learning Regression Algorithms 有权

公开(公告)号：US20210271994A1

公开(公告)日：2021-09-02

申请号：US17190336

申请日：2021-03-02

申请人： Synopsys, Inc.

发明人： Jong Beom Park

IPC分类号： G06N7/00 , G06N20/00 , G06F30/36

摘要： Various embodiments of a method and apparatus for estimating the effective resistance for the design of on-chip power nets are disclosed. Through sampled node resistance, performance of a power net can be determined on an entire chip. Effective resistance predictions can be made for all nodes. Through the resistance predictions, a designer can analyze the which areas would benefit from power and ground augmentation.