公开(公告)号：US20100207650A1

公开(公告)日：2010-08-19

申请号：US12370609

申请日：2009-02-13

申请人： TADAHIKO BABA ,  HIROSHI KUROSAKI

发明人： TADAHIKO BABA ,  HIROSHI KUROSAKI

IPC分类号： G01R31/02 ,  G01R31/14

CPC分类号： G01R31/31937 ,  G01R31/31922

摘要： Provided is a test apparatus for testing a device under test, comprising a multi-strobe generating section that generates, for each prescribed test cycle, a multi-strobe that includes a plurality of strobes arranged at prescribed time intervals; a data detecting section that detects a logic value of a response signal output by the device under test, according to each strobe; and a data width detecting section that detects a data width indicating a period during which the logic value of the response signal matches a prescribed expected value, based on each change point of a logic value output by the data detecting section.

摘要翻译： 提供了一种用于测试被测器件的测试装置，包括：多选通产生部分，用于在每个规定的测试周期产生包括以预定时间间隔布置的多个选通的多次选通; 数据检测部分，根据每个选通信号，检测被被测设备输出的响应信号的逻辑值; 以及数据宽度检测部，其基于由数据检测部输出的逻辑值的每个变化点来检测表示响应信号的逻辑值与规定的期望值相匹配的期间的数据宽度。