Slit lamp microscope
    1.
    发明授权

    公开(公告)号:US09687149B2

    公开(公告)日:2017-06-27

    申请号:US14863966

    申请日:2015-09-24

    发明人: Takeshi Nara

    IPC分类号: A61B3/135 A61B3/00 A61B3/15

    摘要: The slit lamp microscope comprises: a supporting base capable of precisely horizontally moving with respect to a frame; a supporting section extended upward from the supporting base; a slit light unit attached to a front end part of the supporting section, the slit light unit accommodating a slit lamp which emits a slit light downward; a mirror unit attached to a vertical middle part of the supporting section, the mirror unit having a reflecting mirror, which reflects the slit light from the slit light unit toward an eye of an examinee; and a microscope unit for observing the eye of the examinee. A slit lamp power cable, which supplies electric power to the slit lamp and which is extended from the supporting base, is provided in a hollow part of the supporting section and connected to the slit lamp in the slit light unit without being exposed outside.

    Slit lamp microscope capable of observing meibomian gland

    公开(公告)号:US11717158B2

    公开(公告)日:2023-08-08

    申请号:US17025705

    申请日:2020-09-18

    摘要: A slit lamp microscope of the present invention, which is capable of observing a meibomian gland, comprises: a visible light source for emitting slit light; an infrared light source for emitting infrared light, the infrared light source being disposed on a light path of the slit light emitted from the visible light source; a mirror unit including a reflecting mirror or a prism for reflecting the slit light from the visible light source or the infrared light from the infrared light source to irradiate an eye of a subject; and a switching unit for switching the position of the visible light source and the infrared light source, the switching unit being capable of directing one of the visible light source and the infrared light source toward the light path of the slit light.

    Slit lamp microscope
    3.
    发明授权
    Slit lamp microscope 有权
    狭缝灯显微镜

    公开(公告)号:US09265417B2

    公开(公告)日:2016-02-23

    申请号:US14041937

    申请日:2013-09-30

    IPC分类号: A61B3/00 A61B3/10 A61B3/135

    CPC分类号: A61B3/135

    摘要: The slit lamp microscope is capable of easily adjusting a slit-light and a backlight. The slit lamp microscope comprises: a slit lamp for emitting a slit-light; a mirror unit having a reflecting mirror or a prism, which reflects the slit-light emitted from the slit lamp toward an eye of an examinee; a microscope unit for observing the eye of the examinee; and a backlight source for emitting a backlight, which illuminates a circumference of the slit-light, toward the eye of the examinee. The backlight source is provided to the mirror unit.

    摘要翻译: 裂隙灯显微镜能够容易地调节狭缝光和背光。 裂隙灯显微镜包括:用于发射狭缝光的裂缝灯; 具有反射镜或棱镜的反射镜单元,其将从狭缝灯发射的狭缝光朝向受检者的眼睛反射; 用于观察受检者眼睛的显微镜单元; 以及背光源,用于向被检查者的眼睛发射照明狭缝光的周边的背光源。 背光源提供给镜子单元。

    Slit lamp microscope
    4.
    发明授权

    公开(公告)号:US10444484B2

    公开(公告)日:2019-10-15

    申请号:US15699497

    申请日:2017-09-08

    摘要: The slit lamp microscope comprises: a slit light optical system including a slit lamp, and a reflecting mirror or prism for reflecting a slit light from the slit lamp toward an eye of an examinee; and a microscope unit including an object lens, binocular eyepiece lenses, a magnification changing section, which changes magnifications of an image formed by light passing through the optical paths, being provided between the object lens and the eyepiece lenses, and an inward angle changing section, which changes a binocular viewing angle, being provided therebetween. A focal distance of the object lens is made shorter, by an optical path length of the inward angle changing section, than that of an object lens equipped with no inward angle changing section. The inward angle changing section is located closer to the object lens than to the magnification changing section.