公开(公告)号：US20230250513A1

公开(公告)日：2023-08-10

申请号：US17982092

申请日：2022-11-07

Applicant: TANAKA KIKINZOKU KOGYO K.K.

Inventor： Takeshi FUSE ,  Kunihiro SHIMA ,  Takeyuki SAGAE ,  Shinji KOUNO

IPC: C22C5/04 ,  C22C30/02 ,  C22C30/04 ,  C22C30/06 ,  C22F1/14

CPC classification number: C22C5/04 ,  C22C30/02 ,  C22C30/04 ,  C22C30/06 ,  C22F1/14

Abstract: A probe pin material including a Ag—Pd—Cu-based alloy essentially including Ag, Pd and Cu, B as a first additive element, and at least any element of Zn, Bi and Sn, as a second additive element. A concentration of the first additive element is 0.1 mass % or more and 1.5 mass % or less, and a concentration of the second additive element is 0.1 mass % or more and 1.0 mass % or less. A Ag concentration, a Pd concentration and a Cu concentration in the Ag—Pd—Cu-based alloy are required as follows: a Ag concentration (SAg), a Pd concentration (SPd) and a Cu concentration (SCu) converted as given that a Ag—Pd—Cu ternary alloy is formed from only such three elements all fall within a predetermined range in a Ag—Pd—Cu ternary system phase diagram. The probe pin material is excellent in resistance value and hardness/wear resistance, and also is enhanced in bending resistance.