Abstract:
A plasmon generator of a thermally-assisted magnetic recording head has a first configuration member having a near-field light generation end surface at an ABS, and a second configuration member being in contact with main magnetic pole, and terminating at a front end portion of a slope positioned at the position recessed from the ABS. An end part of a separator layer, which is interposed between the main magnetic pole and the first configuration member, on a side opposite to the ABS is at a position more recessed from the air bearing surface than the front end portion of the slope of the second configuration member.
Abstract:
The present invention relates to a plasmon generator, in which a surface plasmon is excited by application of light. The plasmon generator extends along one direction. The plasmon generator includes a first end surface that is positioned on one end in the one direction and at which near-field light is generated along with the excitation of the plasmon; and a second cross section that is substantially parallel to the first end surface and is away from the first end surface. The first end surface has a polygonal shape that does not have a substantially acute inner angle. The second cross section has an upper part that has a shape substantially the same as or similar to that of the first end surface and a flare shaped lower part that is connected to the upper part and has a width that increases as it is far from the upper part.
Abstract:
An image generation device and an appearance inspection device which can increase the number of types of training image are provided. An image generation device includes an image acquisition unit configured to acquire a first image; and an image generator configured to generate a training image based on the first image, wherein the first image depicts a first defect included in a first product of a different type the product to be inspected, and the training image is a image to be read by an identifier that identifies whether an inspection image obtained by imaging the product to be inspected depicts a same type of defect as the first defect and to be used by the identifier to perform learning.