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公开(公告)号：US20250164551A1
公开(公告)日：2025-05-22
申请号：US18955427
申请日：2024-11-21
Applicant: TDK-Micronas GmbH
Inventor： Thilo Rubehn , David Muthers , Timo Kaufmann
Abstract: An electronic component has an integrated circuit, a capacitor, and several conductors that are connected by way of bonding wires with contact elements of the integrated circuit. Two conductors are connected to one another by way of a current path, in which the capacitor, a first electrically conductive layer connecting a first connector of the capacitor to the first conductor, and a second electrically conductive layer connecting a second connector of the capacitor to the second conductor are arranged. The integrated circuit has an impedance measuring device to measure the impedance between the conductors that are connected to one another by way of the current path, which device can be connected to the first conductor by means of a switch. The impedance measuring device is configured to determine the equivalent ohmic series resistance between the conductors. This enables the contact quality of the layers to be tested.
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公开(公告)号：US20240259006A1
公开(公告)日：2024-08-01
申请号：US18423973
申请日：2024-01-26
Applicant: TDK-Micronas GmbH
Inventor： David Muthers
Abstract: A semiconductor chip with an integrated circuit has supply voltage connectors and an output stage with an output for releasing an output signal. The output is connected via a drain-source line of a first self-closing insulated-gate field-effect transistor to an output connection for the output signal. The semiconductor chip has a clock signal generator fed from the supply voltage connections, its clock signal output is connected galvanically decoupled to an input voltage connection of a charge pump. A first output voltage connection of the charge pump is connected to the gate, and a second output voltage connection is connected to the bulk of the insulated-gate field-effect transistor. The output voltage connections are also connected to one another by means of a discharge path.
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公开(公告)号：US20200025836A1
公开(公告)日：2020-01-23
申请号：US16503789
申请日：2019-07-05
Applicant: TDK-Micronas GmbH
Inventor： Marc Baumann , David Muthers , Thomas Desel
Abstract: A Hall sensor has a Hall sensor element, having multiple connection locations and a current supply source or voltage supply source, which has a first and a second supply connector for output of a supply current or a supply voltage. The first supply connector is connected or can be connected with a first connection location to feed a current into the Hall sensor element, and the second supply connector is connected or can be connected with a second connection location of the Hall sensor element. The Hall sensor has a NAND gate, which is connected with the first connection location of the Hall sensor element using a first input, and with the second connection location of the Hall sensor element using a second input, and has an output for output of a first error signal. Alternatively or in addition to the NAND gate, the Hall sensor can have a NOR gate, which is connected with the third connection location using a first input connector, and with the fourth connection location using a second input connector, and has an output connector for output of a second error signal.
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Patent Agency Ranking
公开(公告)号：US20240118354A1
公开(公告)日：2024-04-11
申请号：US18376886
申请日：2023-10-05
Applicant: TDK - Micronas GmbH
Inventor： Jörg Franke , David Muthers
IPC: G01R33/09
CPC classification number: G01R33/09
Abstract: A device and a method for compensating a harmonic in an output voltage of at least one xMR sensor assembly is provided. The device includes the at least one xMR sensor assembly including at least one magnetoresistive element, at least one excitation magnet, at least one demodulation unit, a scaling unit and a superposing unit. The method includes detecting the output voltage of the at least one xMR sensor assembly in a demodulation unit, converting the output voltage of the at least one xMR sensor assembly in the demodulation unit, generating a compensation voltage from the demodulation voltage in a scaling unit, and superposing the compensation voltage with the output voltage of the at least one xMR sensor assembly in a superposing unit.
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公开(公告)号：US20250130295A1
公开(公告)日：2025-04-24
申请号：US18921331
申请日：2024-10-21
Applicant: TDK - Micronas GmbH
Inventor： David Muthers , Jörg Franke
IPC: G01R33/025 , G01R33/00
Abstract: A method for processing detection signals of magnetic field sensors, the method comprising generating a magnetic field by an excitation magnet; detecting a magnetic flux density B1, . . . , Bn of the generated magnetic field by means of a number n≥2 of magnetic field sensors S1, . . . , Sn arranged on a circuit main surface of an integrated circuit; outputting detection signals VS1, . . . , VSn proportional to the magnetic flux density B1, . . . , Bn detected by the n magnetic field sensors S1, . . . , Sn to the integrated circuit; gain correcting the output detection signals VS1, . . . , VSn; transforming the phase-corrected detection signals VS1′, . . . , VSn′ and gain correcting the transformed detection signals Vt1, Vt2.
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公开(公告)号：US10907989B2
公开(公告)日：2021-02-02
申请号：US16195896
申请日：2018-11-20
Applicant: TDK—Micronas GmbH
Inventor： David Muthers
Abstract: A device and method for the processing of a measurement signal of a magnetic field B(φ) is described. The device comprises a permanent magnet having two or four poles, an odd number of magnetic field sensors that are arranged in a plane below the magnets, and a signal processing unit, which is adapted to detect the values of the odd number of magnetic field sensors, to filter the fundamental frequency of the magnetic field out of the detected values of the lateral magnetic field sensors in order to calculate the value of the rotation angle from the fundamental frequency.
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公开(公告)号：US20200025842A1
公开(公告)日：2020-01-23
申请号：US16511181
申请日：2019-07-15
Applicant: TDK-Micronas GmbH
Inventor： Marc Baumann , David Muthers , Thomas Desel
Abstract: A Hall sensor has a Hall sensor element, which has multiple connection points spaced apart from one another. A supply source serves for feeding an exciter current into the Hall sensor element and is connected to a first and a second connection point of the Hall sensor element. The Hall sensor has a first and a second comparison device. The first comparison device has a first input connected to a third connection point of the Hall sensor element, a second input connected to a reference signal generator for an upper reference value signal, and an output for a first comparison signal. The second comparison device has a third input connected to the third connection point, a fourth input connected to a reference signal generator for a lower reference value signal, and an output for a second comparison signal. The outputs are connected to an evaluation device for generating an error signal as a function of the first and second comparison signal.
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公开(公告)号：US20190162557A1
公开(公告)日：2019-05-30
申请号：US16195896
申请日：2018-11-20
Applicant: TDK - Micronas GmbH
Inventor： David Muthers
IPC: G01D5/14
Abstract: A device and method for the processing of a measurement signal of a magnetic field B(φ) is described. The device comprises a permanent magnet having two or four poles, an odd number of magnetic field sensors that are arranged in a plane below the magnets, and a signal processing unit, which is adapted to detect the values of the odd number of magnetic field sensors, to filter the fundamental frequency of the magnetic field out of the detected values of the lateral magnetic field sensors in order to calculate the value of the rotation angle from the fundamental frequency.
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