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公开(公告)号：US20180052190A1
公开(公告)日：2018-02-22
申请号：US15801067
申请日：2017-11-01
Applicant: TECHNOPROBE S.p.A.
Inventor： Daniele Perego , Simone Todaro
Abstract: A testing head for testing the working of a device under test comprises a plurality of contact probes, each contact probe having a rod-like body of a predetermined length that extends between a first end and a second end and being housed in respective guide holes made in at least one plate-like lower guide and one plate-like upper guide that are parallel to each other and spaced apart by a bending zone. Suitably, at least one of the lower guide and upper guide is equipped with at least one recessed portion formed at a plurality of those guide holes and realizing lowered portions thereof adapted to reduce a thickness of the plurality of those guide holes.
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公开(公告)号：US10698003B2
公开(公告)日：2020-06-30
申请号：US15801067
申请日：2017-11-01
Applicant: TECHNOPROBE S.p.A.
Inventor： Daniele Perego , Simone Todaro
Abstract: A testing head for testing the working of a device under test comprises a plurality of contact probes, each contact probe having a rod-like body of a predetermined length that extends between a first end and a second end and being housed in respective guide holes made in at least one plate-like lower guide and one plate-like upper guide that are parallel to each other and spaced apart by a bending zone. Suitably, at least one of the lower guide and upper guide is equipped with at least one recessed portion formed at a plurality of those guide holes and realizing lowered portions thereof adapted to reduce a thickness of the plurality of those guide holes.
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