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公开(公告)号:US20220069118A1
公开(公告)日:2022-03-03
申请号:US17511134
申请日:2021-10-26
申请人: Tessera, Inc.
发明人: Huiming Bu , Kangguo Cheng , Dechao Guo , Sivananda K. Kanakasabapathy , Peng Xu
IPC分类号: H01L29/78 , H01L29/66 , H01L29/10 , H01L29/16 , H01L29/161 , H01L29/06 , H01L21/8234 , H01L21/8238 , H01L21/84 , H01L21/3065 , H01L21/324
摘要: A semiconductor device includes one or more fins. Each fin includes a top channel portion formed from a channel material, a middle portion, and a bottom substrate portion formed from a same material as an underlying substrate. An oxide layer is formed between the bottom substrate portion of each fin and the isolation layer, with a space between a sidewall of at least a top portion of the isolation dielectric layer and an adjacent sidewall of the one or more fins, above the oxide layer. A gate dielectric, protruding into the space and in contact with the middle portion, is formed over the one or more fins and has a portion formed from a material different from the oxide layer.
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公开(公告)号:US11189729B2
公开(公告)日:2021-11-30
申请号:US16685229
申请日:2019-11-15
申请人: TESSERA, INC.
发明人: Huiming Bu , Kangguo Cheng , Dechao Guo , Sivananda K. Kanakasabapathy , Peng Xu
IPC分类号: H01L29/78 , H01L29/06 , H01L29/66 , H01L29/10 , H01L29/16 , H01L29/161 , H01L21/8234 , H01L21/8238 , H01L21/84 , H01L21/3065 , H01L21/324
摘要: A semiconductor device includes one or more fins. Each fin includes a top channel portion formed from a channel material, a middle portion, and a bottom substrate portion formed from a same material as an underlying substrate. An oxide layer is formed between the bottom substrate portion of each fin and the isolation layer, with a space between a sidewall of at least a top portion of the isolation dielectric layer and an adjacent sidewall of the one or more fins, above the oxide layer. A gate dielectric, protruding into the space and in contact with the middle portion, is formed over the one or more fins and has a portion formed from a material different from the oxide layer.
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公开(公告)号:US11094824B2
公开(公告)日:2021-08-17
申请号:US16685329
申请日:2019-11-15
申请人: TESSERA, INC.
发明人: Huiming Bu , Kangguo Cheng , Dechao Guo , Sivananda K Kanakasabapathy , Peng Xu
IPC分类号: H01L29/78 , H01L29/66 , H01L29/10 , H01L29/16 , H01L29/161 , H01L29/06 , H01L21/8234 , H01L21/8238 , H01L21/84 , H01L21/3065 , H01L21/324
摘要: A semiconductor device includes one or more fins. Each fin includes a top channel portion formed from a channel material, and a bottom substrate portion formed from a same material as an underlying substrate. An isolation dielectric layer is formed between and around the bottom substrate portion of the one or more fins. A single oxide layer is formed in direct contact with the bottom substrate portion of each fin, between the bottom substrate portion of each fin and the isolation dielectric layer. A gate dielectric is formed over the one or more fins and between a straight sidewall of at least a top portion of the single oxide layer and an adjacent sidewall of the one or more fins, in contact with both the straight sidewall and the bottom substrate portion.
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公开(公告)号:US10593802B2
公开(公告)日:2020-03-17
申请号:US15629280
申请日:2017-06-21
申请人: TESSERA, INC.
发明人: Huiming Bu , Kangguo Cheng , Dechao Guo , Sivananda K. Kanakasabapathy , Peng Xu
IPC分类号: H01L21/76 , H01L29/78 , H01L29/66 , H01L29/10 , H01L29/16 , H01L29/161 , H01L29/06 , H01L21/8234 , H01L21/8238 , H01L21/84 , H01L21/3065 , H01L21/324
摘要: Semiconductor devices include one or more fins. Each fin includes a top channel portion formed from a channel material and a bottom substrate portion formed from a same material as an underlying substrate, the top channel portion having a different width than the bottom substrate portion. An isolation dielectric layer formed between and around the bottom substrate portion of the one or more fins. A space exists between at least a top portion of the isolation dielectric layer and the one or more fins. A gate dielectric is formed over the one or more fins and in the space.
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