公开(公告)号：US20210280422A1

公开(公告)日：2021-09-09

申请号：US17328569

申请日：2021-05-24

申请人： Tessera, Inc.

发明人： Sean D. Burns ,  Lawrence A. Clevenger ,  Matthew E. Colburn ,  Nelson M. Felix ,  Sivananda K. Kanakasabapathy ,  Christopher J. Penny ,  Roger A. Quon ,  Nicole A. Saulnier

IPC分类号： H01L21/033 ,  H01L21/311 ,  H01L21/768 ,  H01L23/528 ,  H01L21/3213

摘要： A method of forming a structure for etch masking that includes forming first dielectric spacers on sidewalls of a plurality of mandrel structures and forming non-mandrel structures in space between adjacent first dielectric spacers. Second dielectric spacers are formed on sidewalls of an etch mask having a window that exposes a connecting portion of a centralized first dielectric spacer. The connecting portion of the centralized first dielectric spacer is removed. The mandrel structures and non-mandrel structures are removed selectively to the first dielectric spacers to provide an etch mask. The connecting portion removed from the centralized first dielectric spacer provides an opening connecting a first trench corresponding to the mandrel structures and a second trench corresponding to the non-mandrel structures.

公开(公告)号：US11018007B2

公开(公告)日：2021-05-25

申请号：US16675630

申请日：2019-11-06

申请人： TESSERA, INC.

发明人： Sean D. Burns ,  Lawrence A. Clevenger ,  Matthew E. Colburn ,  Nelson M. Felix ,  Sivananda K. Kanakasabapathy ,  Christopher J. Penny ,  Roger A. Quon ,  Nicole A. Saulnier

IPC分类号： H01L21/033 ,  H01L21/311 ,  H01L21/768 ,  H01L23/528 ,  H01L21/3213 ,  H01L21/31 ,  H01L21/027 ,  H01L45/00 ,  H01L21/28 ,  H01L51/00

摘要： A method of forming a structure for etch masking that includes forming first dielectric spacers on sidewalls of a plurality of mandrel structures and forming non-mandrel structures in space between adjacent first dielectric spacers. Second dielectric spacers are formed on sidewalls of an etch mask having a window that exposes a connecting portion of a centralized first dielectric spacer. The connecting portion of the centralized first dielectric spacer is removed. The mandrel structures and non-mandrel structures are removed selectively to the first dielectric spacers to provide an etch mask. The connecting portion removed from the centralized first dielectric spacer provides an opening connecting a first trench corresponding to the mandrel structures and a second trench corresponding to the non-mandrel structures.

公开(公告)号：US20220069118A1

公开(公告)日：2022-03-03

申请号：US17511134

申请日：2021-10-26

申请人： Tessera, Inc.

发明人： Huiming Bu ,  Kangguo Cheng ,  Dechao Guo ,  Sivananda K. Kanakasabapathy ,  Peng Xu

IPC分类号： H01L29/78 ,  H01L29/66 ,  H01L29/10 ,  H01L29/16 ,  H01L29/161 ,  H01L29/06 ,  H01L21/8234 ,  H01L21/8238 ,  H01L21/84 ,  H01L21/3065 ,  H01L21/324

摘要： A semiconductor device includes one or more fins. Each fin includes a top channel portion formed from a channel material, a middle portion, and a bottom substrate portion formed from a same material as an underlying substrate. An oxide layer is formed between the bottom substrate portion of each fin and the isolation layer, with a space between a sidewall of at least a top portion of the isolation dielectric layer and an adjacent sidewall of the one or more fins, above the oxide layer. A gate dielectric, protruding into the space and in contact with the middle portion, is formed over the one or more fins and has a portion formed from a material different from the oxide layer.

公开(公告)号：US11189729B2

公开(公告)日：2021-11-30

申请号：US16685229

申请日：2019-11-15

申请人： TESSERA, INC.

发明人： Huiming Bu ,  Kangguo Cheng ,  Dechao Guo ,  Sivananda K. Kanakasabapathy ,  Peng Xu

IPC分类号： H01L29/78 ,  H01L29/06 ,  H01L29/66 ,  H01L29/10 ,  H01L29/16 ,  H01L29/161 ,  H01L21/8234 ,  H01L21/8238 ,  H01L21/84 ,  H01L21/3065 ,  H01L21/324

摘要： A semiconductor device includes one or more fins. Each fin includes a top channel portion formed from a channel material, a middle portion, and a bottom substrate portion formed from a same material as an underlying substrate. An oxide layer is formed between the bottom substrate portion of each fin and the isolation layer, with a space between a sidewall of at least a top portion of the isolation dielectric layer and an adjacent sidewall of the one or more fins, above the oxide layer. A gate dielectric, protruding into the space and in contact with the middle portion, is formed over the one or more fins and has a portion formed from a material different from the oxide layer.

公开(公告)号：US10593802B2

公开(公告)日：2020-03-17

申请号：US15629280

申请日：2017-06-21

申请人： TESSERA, INC.

发明人： Huiming Bu ,  Kangguo Cheng ,  Dechao Guo ,  Sivananda K. Kanakasabapathy ,  Peng Xu

IPC分类号： H01L21/76 ,  H01L29/78 ,  H01L29/66 ,  H01L29/10 ,  H01L29/16 ,  H01L29/161 ,  H01L29/06 ,  H01L21/8234 ,  H01L21/8238 ,  H01L21/84 ,  H01L21/3065 ,  H01L21/324

摘要： Semiconductor devices include one or more fins. Each fin includes a top channel portion formed from a channel material and a bottom substrate portion formed from a same material as an underlying substrate, the top channel portion having a different width than the bottom substrate portion. An isolation dielectric layer formed between and around the bottom substrate portion of the one or more fins. A space exists between at least a top portion of the isolation dielectric layer and the one or more fins. A gate dielectric is formed over the one or more fins and in the space.