公开(公告)号：US11368150B2

公开(公告)日：2022-06-21

申请号：US16555482

申请日：2019-08-29

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Gangyao Wang ,  Xiong Li ,  Suxuan Guo

IPC: H03K17/18 ,  H03K17/687

Abstract: A device includes an output circuit configured to drive a gate of a field effect transistor (FET) in response to a drive signal. The FET includes a body diode. Control logic is configured to generate the drive signal to control the output circuit to drive the FET. A measurement circuit is configured to sample a first voltage across the FET in response to a first state of the drive signal and configured to sample a second voltage across the FET in response to a second state of the drive signal. The second state of the drive signal is different from the first state. The control logic is configured to determine a difference between the first voltage and a reference voltage. The control logic is configured to compare the difference to a degradation threshold to determine a level of degradation of the FET. The reference voltage is determined based on the second voltage.

公开(公告)号：US11070197B1

公开(公告)日：2021-07-20

申请号：US16731474

申请日：2019-12-31

Applicant: Texas Instruments Incorporated

Inventor： Gangyao Wang ,  Rajarshi Mukhopadhyay ,  Miguel Aguirre

IPC: H03K3/011 ,  H03K17/687 ,  H03M1/12

Abstract: Methods, apparatus, systems and articles of manufacture are described for transistor health monitoring. An example gate driver includes a request receiver pin, a measurement transmitter pin, and a driver control logic pin, the request receiver pin, the measurement transmitter pin, and the driver control logic pin configured to be coupled to a controller, a sensing pin, the sensing pin to be coupled to a sensing circuit, a control logic circuit having an input coupled to the request receiver pin, a transistor coupled to the control logic circuit and the sensing pin, a multiplexer coupled to the control logic circuit and the sensing pin, an analog-to-digital converter (ADC) coupled to the multiplexer and the measurement transmitter pin, and a driver control logic circuit coupled to the driver control logic pin.

公开(公告)号：US20210203309A1

公开(公告)日：2021-07-01

申请号：US16731474

申请日：2019-12-31

Applicant: Texas Instruments Incorporated

Inventor： Gangyao Wang ,  Rajarshi Mukhopadhyay ,  Miguel Aguirre

IPC: H03K3/011 ,  H03M1/12 ,  H03K17/687

Abstract: Methods, apparatus, systems and articles of manufacture are described for transistor health monitoring. An example gate driver includes a request receiver pin, a measurement transmitter pin, and a driver control logic pin, the request receiver pin, the measurement transmitter pin, and the driver control logic pin configured to be coupled to a controller, a sensing pin, the sensing pin to be coupled to a sensing circuit, a control logic circuit having an input coupled to the request receiver pin, a transistor coupled to the control logic circuit and the sensing pin, a multiplexer coupled to the control logic circuit and the sensing pin, an analog-to-digital converter (ADC) coupled to the multiplexer and the measurement transmitter pin, and a driver control logic circuit coupled to the driver control logic pin.