公开(公告)号：US10184980B2

公开(公告)日：2019-01-22

申请号：US15395307

申请日：2016-12-30

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Naman Maheshwari ,  Wilson Pradeep ,  Prakash Narayanan

IPC: G01R31/317 ,  G01R31/3177 ,  G01R31/3193

Abstract: A system includes a multiple input signature register (MISR) to receive outputs from M different scan chains in response to N test patterns applied to test an integrated circuit. The MISR provides N test signatures for the integrated circuit based on the outputs of the M different scan chains generated in response to each of the N test patterns. Each of the scan chains holds one or more test data bits that represent behavior of the integrated circuit in response to each of the N test patterns. A shift register is loaded from an interface and holds one of N comparison signatures that is used to validate a respective one of the N test signatures generated according to a given one of the N test patterns. A comparator compares each of the N test signatures with a respective one of the N comparison signatures to determine a failure condition based on the comparison.

公开(公告)号：US11209481B2

公开(公告)日：2021-12-28

申请号：US16217289

申请日：2018-12-12

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Naman Maheshwari ,  Wilson Pradeep ,  Prakash Narayanan

IPC: G01R31/317 ,  G01R31/3185 ,  G01R31/3193 ,  G01R31/3177

Abstract: A system includes a multiple input signature register (MISR) to receive outputs from M different scan chains in response to N test patterns applied to test an integrated circuit. The MISR provides N test signatures for the integrated circuit based on the outputs of the M different scan chains generated in response to each of the N test patterns. Each of the scan chains holds one or more test data bits that represent behavior of the integrated circuit in response to each of the N test patterns. A shift register is loaded from an interface and holds one of N comparison signatures that is used to validate a respective one of the N test signatures generated according to a given one of the N test patterns. A comparator compares each of the N test signatures with a respective one of the N comparison signatures to determine a failure condition based on the comparison.