FAIL-OPEN ISOLATOR
    1.
    发明公开
    FAIL-OPEN ISOLATOR 审中-公开

    公开(公告)号:US20230268270A1

    公开(公告)日:2023-08-24

    申请号:US17677729

    申请日:2022-02-22

    IPC分类号: H01L23/525 H02H3/04

    CPC分类号: H01L23/5256 H02H3/046

    摘要: A device includes first and second device terminals, a fuse, a first circuit, a first transistor, and a control circuit. The fuse terminal couples to the first device terminal. The first circuit couples to the second fuse terminal. The second fuse terminal has a first voltage. The first transistor has a first control input and first and second current terminals. The first current terminal couples to the second fuse terminal, and the second current terminal couples to the second device terminal. The control circuit: turns “on” the first transistor into a saturation region if the first voltage exceeds a threshold and a current through the fuse exceeds a trip threshold current of the fuse; and turns “on” the first transistor into a linear region if the first voltage exceeds a threshold and a current through the fuse is below the trip threshold current of the fuse.